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Allalin

Hybridized SEM – Spectroscopic Platform

  • SEM – Quantitative Cathodoluminescence (qCL)
  • Spectroscopic Analysis (Photoluminescence, Raman, …)
  • Time-resolved measurements (TRCL, TRPL, g², …)
  • Electrical Measurements (EBIC/EBAC)
  • Room to low-temperature analyses (<10K)
  • Cryo-compatible Nanoprobes
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Characteristics

About our Hybridized SEM – Spectroscopic Platform

The Allalin is a nanometer-resolution SEM-spectroscopic instrument featuring a unique optical collection objective integrated within the SEM column, which allows for robust and repeatable measurements, enabling quantitative cathodoluminescence (qCL) analysis.

One Platform, Multiple Measurement Possibilities

The Allalin platform supports a wide range of spectroscopic analysis techniques, utilizing multiple sources (electron beam or laser, in continuous or pulsed mode) and various detectors (SE detector, PMT, CCD/Streak cameras, InGaAs/TCSPC/HPD detectors).

The system can also be equipped with options like in-SEM electrical probing, Raman spectroscopy, Photoluminescence, and HBT setup for g(2) autocorrelation measurement.

Different stage options are available to accommodate samples as small as a few micrometers to wafers up to 6 inches.

Finally, spectroscopic analyses can be conducted at temperatures ranging from 10 K to 320 K, thanks to an integrated helium cryostat and a unique hexapod-based stage design, which ensures high stability and very low drift (<5 nm/min).

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Trusted by top semiconductor companies and prestigious research institutes worldwide

Applications

Related Applications Using the Allalin Platform

Discover how the Allalin platform can support your research.

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Process development
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Materials Science
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Micro/Nanowire
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GaN device
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Power electronics
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Life Science
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Optoelectronics

Scientific references

Halide Homogenization for High-Performance Blue Perovskite Electroluminescence L. Cheng, C. Yi, Y. Tong, L. Zhu, G. Kusch, X. Wang, T. Jiang, H. Zhang, J. Zhang, C. Xue, H. Chen, W. Xu, D. Liu, R. A. Oliver, R. H. Friend, L. Zhang, N. Wang, W. Huang, J. Wang AAAS Research, 2020, Article ID 9017871 2020
Advances in Cathodoluminescence: Recent steps toward Semiconductor Fabs and FA Labs C. Monachon, M. Davies, ADFAAO Compound Semiconductor, 2020, 4:28-33 2020
Mechanical stress in InP and GaAs ridges formed by reactive ion etching J. P. Landesman, M. Fouchier, E. Pargon, S. Gerard, N. Rochat, C. Levallois, M. Mokhtari, P. Pagnod-Rossiaux, F. Laruelle, C. Petit-Etienne, M. Bettiati, J. Jimenez, D. T. Cassidy Journal of Applied Physics, 128(22), 225705, 2020 2020
Growth and characterisation of earth-abundant semiconductor nanostructures for solar energy harvesting S. R. Escobar Steinvall Thesis No. 8213, EPFL, 2020 2020

Scientific references

Seeing and Measuring in Colours: Electron Microscopy and Spectroscopies Applied to Nano-optics KOCIACK, M., STÉPHAN, O., GLOTER, A., ZAGONEL, L. F., TIZEI, L. H. G., TENCÉ, M., MARCH, K., BLAZIT, J. D., MAHFOUD, Z., LOSQUIN, A., MEURET, S., COLLIEX, C. Comptes Rendus Physique, 2014, 15, 158–175 2014
Polarity-Driven Nanometric Luminescence Asymmetry in AlN/GaN Heterostructures TIZEI, L. H. G., MEURET, S., MARCH, K., HESTROFFER, K., AUZELLE, T., DAUDIN, B., KOCIACK, M. Applied Physics Letters, 2014, 105, 143106 2014
Cathodoluminescence in a Scanning Transmission Electron Microscope: A Nanometer-Scale Counterpart of Photoluminescence for the Study of II–VI Quantum Dots MAHFOUD, Z., DIJKSMAN, A. T., JAVAU, C., BASSOUL, P., BAUDRION, A.-L., PLAIN, J., DUBERTRET, B., KOCIACK, M. The Journal of Physical Chemistry Letters, 2013, 4, 4090–4094 2013
Structural and Optical Properties of AlxGa1-xN Nanowires PIERRET, A., BOUGEROL, C., DEN HERTOG, M., GAYRAL, B., KOCIACK, M., RENEVIER, H., DAUDIN, B. Physica Status Solidi RRL, 2013, 7, 868 2013

Ready to revolutionize your materials characterization approach?

Get in touch with us today to discover how our state-of-the-art cathodoluminescence tools can elevate your research and industry applications.
Already more than 30 systems installed globally!