Beam blanker

The Allalin platform offers a beam blanker option, providing enhanced control over the electron beam. This feature allows users to precisely interrupt or modulate the electron beam during measurements, reducing beam-induced effects and improving the accuracy of time-resolved cathodoluminescence (TRCL) analysis.

The beam blanker option on the Allalin platform can serve as either an alternative or complement to the picosecond pulsed laser, offering precise control over the electron beam and enabling time-resolved measurements without the need for pulsed light sources. This simplifies the process by eliminating synchronization requirements while still achieving high temporal resolution.

Key Benefits:

Simpler Integration: The beam blanker can be easily integrated into existing Allalin scanning electron microscope (SEM) systems that are already set up for cathodoluminescence experiments, eliminating the need for additional laser systems.
Cost-Effectiveness: It is a more affordable option compared to the high cost of a picosecond pulsed laser system.
Ease of Use: The beam blanker requires minimal alignment beyond the initial installation and enables quicker switching between pulsed and continuous wave (CW) modes.
Flexible Timing Control: Attolight’s beam blanker provides flexible control over the electron beam’s on-off cycles, allowing for different time intervals and pulse durations based on experimental needs.

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Complementary Role:

When used alongside picosecond pulsed lasers, the beam blanker enhances experimental versatility:

Broader Range of Experiments: Beam blanking is ideal when the laser’s minimum repetition rate is too high to accommodate long lifetimes in the studied system. It can also be combined with laser pulses for applications requiring multiple modulation levels.
Cross-Validation: Using both methods together allows for cross-validation of results, providing a more comprehensive understanding of material behavior under different excitation conditions.