Cryogenic Nanoprobes
Cryogenic nanoprobes offer nano-precision electrical probing for high-accuracy measurements. They are integrated and compatible with the Allalin nano- and cryo-stage for versatile, temperature-controlled applications involving 2 probes or less.
Closed-loop, absolute encoder controllers allow for nanometric position repeatability over the whole electron microscope field of view.
The nanoprobes are optimized for operation in the cathodoluminescence collection plane, making correlative microscopy a key feature of the tool. They are also compatible with the SE detector, minimizing SE signal loss.
Nanoprobes
- Large range of designs from ultra-sharp (<12nm-radius) to highly stable tips
Option
Probe tip etching station:
- Robust and easy-to-use station to produce and design your own tips (< 10min)
Specifications
1 Distance that can be travelled without stick-slip events of the positioner occurring, operating the prober within its Scan-Range helps to minimize vibrations. The listed scan-range is available with the optional X-Extension
2 Optionally with integrated Probe-Sensor to detect contact with the sample
