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Applications in Cathodoluminescence

Explore the diverse applications of our advanced cathodoluminescence technologies across various materials studies. 

Power Electronics
Quantum technologies
Sensors
Life sciences
Energy Materials
RF / power transistors
Optoeletronics
Failure analysis
Process control
Process development
Fundamental and applied research
II-VI semiconductors
Rare-earth doped phosphors
Phosphide semiconductors
Polymers & Biopolymers
Plasmonic/metamaterials
Arsenide semiconductors
Transition metal dichalcogenides
Halide perovskites
Diamond
Oxide semiconductors
Silicon carbide
Silicon and alloys
Nitride semiconductors
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Power Electronics
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Quantum technologies
Text Link
Sensors
Text Link
Life sciences
Text Link
Energy Materials
Text Link
RF / power transistors
Text Link
Optoeletronics
Text Link
Failure analysis
Text Link
Process control
Text Link
Process development
Text Link
Fundamental and applied research
Text Link
II-VI semiconductors
Text Link
Rare-earth doped phosphors
Text Link
Phosphide semiconductors
Text Link
Polymers & Biopolymers
Text Link
Plasmonic/metamaterials
Text Link
Arsenide semiconductors
Text Link
Transition metal dichalcogenides
Text Link
Halide perovskites
Text Link
Diamond
Text Link
Oxide semiconductors
Text Link
Silicon carbide
Text Link
Silicon and alloys
Text Link
Nitride semiconductors
Text Link
Application

Dislocation type determination by cathodoluminescence

Find out how CL can determine threading dislocation types
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Application

Resolving individual quantum emitters in GaN-AlN superlattice nanowires

We show how CL-STEM can be used for highly localized optical characterization of quantum emitters
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Application

Non-destructive quality control of micron-sized light emitting diodes

We will show how spectrally resolved quantitative CL can address this challenge.
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Application

Comprehensive defect review and classification for SiC

We show how spectrally-resolved quantitative CL can be used to classify various defects in SiC
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Application

Correlating structural and optical properties of lead halide perovskites

We will introduce CL-STEM as a complementary technique to other in-STEM characterization methods for identifying the physical origin of lead halide perovskite optical properties.
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Application

Non-destructive control of epitaxial layer uniformity in GaN power devices

We will show how spectrally-resolved quantitative CL can address this challenge
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