Attend our presentation on Thursday, December 13, 2018 13:40-14:30 at Semicon Japan!

Statistical process control in compound semiconductor manufacturing

Samuel Sonderegger, our CEO, will introduce example applications where cathodoluminescence (CL) can be used to detect defects in III-V manufacturing, R&D and failure analysis.

He we will also introduce Attolight’s brand new Santis 300 full wafer CL tool, discuss particular use cases and highlight potential and flexibility in III-V and R&D.

Do not hesitate to visit Tokyo Instruments booth #3021, our representative in Japan, to learn more about Attolight’s products !

We are really looking forward to seeing you!