CS International Conference

Attolight will be present at CS International on April 10 and 11, 2018, in Brussels, Belgium.

Visit us to learn more about our Industry-leading CL-SEM products for semiconductor characterization and defect inspection – highest performance systems available on the market.


Attend our presentation : Wednesday, April 11th, at 10h05

Improving LED manufacturing by Full Wafer Cathodoluminescence 

Samuel Sonderegger, our CEO, will give a short introduction to high resolution cathodoluminescence and highlight its capability to detect subsurface defects combined with nanometer scale mapping resolution. 

He will present applications where cathodoluminescence can be used to detect yield limiting defects in III-V manufacturing, research & development and failure analysis. Finally, he will introduce Attolight’s brand new automated full wafer CL tool and focus on particular use cases of the tool to highlight its potential and flexibility in III-V manufacturing and R&D. 

We are looking forward to seeing you in Brussels!