Webinar: Combined Light and Electron Beam Techniques in STEM (March 26, 2026)

Attolight invites researchers and microscopy specialists to join an upcoming webinar exploring combined light and electron beam techniques in Scanning Transmission Electron Microscopy (STEM) using the Attolight Mönch system.

Presented by Nicholas Morgan, Applications Engineer at Attolight, the session will introduce the Attolight Mönch, an add-on solution designed for cathodoluminescence (CL) spectroscopy and focused light injection in STEM. The webinar will highlight how integrating optical and electron-beam methods enables powerful new approaches for studying materials at the nanoscale.

What the Webinar Will Cover

During the webinar, attendees will:

• Explore combined light and electron beam techniques in STEM, enabling new experimental capabilities in nanoscale characterization.
• Discover the Mönch system’s key features, including its high numerical aperture (NA) mirror, robust positioning system, and seamless switching between experimental modes.
• Review published results from current users, illustrating the diverse range of research applications made possible by the system worldwide.

By combining optical excitation and electron-beam analysis, the Mönch platform opens new possibilities for advanced materials research in fields such as photonics, semiconductor physics, and nanotechnology.

Who Should Attend

This webinar is designed for electron microscopy users, materials scientists, and researchers interested in advanced optical and cathodoluminescence techniques in STEM.

Participants will also have the opportunity to ask questions and discuss how the Mönch system could support their own cutting-edge research.

Registration

The webinar will take place on March 26, 2026 at 5:00 PM (CET).

Register to attend using the link below:
https://events.teams.microsoft.com/event/102fc42b-4faa-4931-b7d1-4272997a966a@d6a73a8f-58b8-4bb6-9972-637887334d72

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