Background moutain Attolight
Mönch

Light Collection / Injection for STEM

The Mönch is an advanced add-on designed for efficient light collection and injection in Scanning Transmission Electron Microscopy (STEM).

Dashboard mockup
Characteristics

About our Light Collection / Injection for STEM

The Mönch add-on is a unique tool that can operate in either a light collection or light injection mode, thanks to its specific mirror design. In addition, the flexibility of the add-on allows an external coupling either in free space or via an optical fiber.

In light-collection mode, it achieves a high signal-to-noise ratio through:

  • An independently moving mirror guaranteeing access to any region of interest of the sample
  • A proprietary mirror with precise alignment for small pole piece gaps (down to 5 mm)
  • A precise sub-micrometer alignment for a perfect adjustment of the mirror with respect to the sample
  • A reduced working distance of 300 µm for highest efficiency
  • A patented optical fiber preserving brightness and spectral resolution

In light-injection mode, it offers:

  • A <10 micron-sized beam for localized sample excitation
  • The ability to perform simultaneous light injection and collection
Dashboard mockup
Features

Connect a Light Collection / Injection for STEM

The mirror operates independently of the sample holder, providing flexibility and ease of alignment with both the electron beam and the sample. This design also allows free sample displacement, enabling the scanning of larger surface areas.

The Mönch arm can be fully retracted from the sample area, making it compatible with virtually all standard STEM options, such as EDS, HAADF, and other detectors. It is also fully compatible with and complementary to EELS analysis.

Light collection is achieved through a patented asymmetric, broadband multicore fiber that preserves the field of view, collection efficiency, and spectral resolution.

The solution is delivered with software natively designed to support script commands, enabling user-defined automation.

Trusted by top semiconductor companies and prestigious research institutes worldwide

Applications

Related Applications Using the Mönch Add-On

Discover how the Allalin platform can support your research.

Text Link
Process development
Text Link
Materials Science
Text Link
Micro/Nanowire
Text Link
GaN device
Text Link
Power electronics
Text Link
Life Science
Text Link
Optoelectronics

Scientific references

Characterizations and Modeling of Grown MQS Nanowires with GaInN/GaN Superlattice Structures YAN, Jinjian, INABA, Soma, LU, Weifang, et al. Cryst. Growth Des. 2025, 25, 3, 639–649 2025
Novel Scintillators Based on Cerium-Doped Garnets in Amorphous Silica: Crystal Quality at the Costs of Glass. NARGELAS, Saulius, SKRUODIENE, Monika, SOLOVJOVAS, Arnoldas, et al. Available at SSRN 5126291. 2025
Wide‐Bandgap Cu (In, Ga) S2 Solar Cell: Mitigation of Composition Segregation in High Ga Films for Better Efficiency ADELEYE, Damilola, SOOD, Mohit, VALLUVAR OLI, Arivazhagan, et al. Small, p. 2405221. 2025
Nanosecond nanothermometry in an electron microscope CASTIONI, Florian, AUAD, Yves, BLAZIT, Jean-Denis, et al. Nano Lett. 2025 2025

Scientific references

InGaN Nanowires with High InN Molar Fraction: Growth, Structural and Optical Properties ZHANG, X., LOURENÇO-MARTINS, H., MEURET, S., KOCIACK, M., HAAS, B., ROUVIÈRE, J.-L., JOUNEAU, P. H., BOUGEROL, C., AUZELLE, T., JALABERT, D., BIQUARD, X., GAYRAL, B., DAUDIN, B. Nanotechnology, 2016, 27, 195704 2016
Lifetime Measurements Well below the Optical Diffraction Limit MEURET, S., TIZEI, L. H. G., AUZELLE, T., SONGMUANG, R., DAUDIN, B., GAYRAL, B., KOCIACK, M. ACS Photonics, 2016, 3, 1157–1163 2016
Extinction and Scattering Properties of High-Order Surface Plasmon Modes in Silver Nanoparticles Probed by Combined Spatially Resolved Electron Energy Loss Spectroscopy and Cathodoluminescence KAWASAKI, N., MEURET, S., WEIL, R., LOURENÇO-MARTINS, H., STÉPHAN, O., KOCIACK, M. ACS Photonics, 2016, 3, 1654–1661 2016
Unveiling Nanometer Scale Extinction and Scattering Phenomena through Combined Electron Energy Loss Spectroscopy and Cathodoluminescence Measurements LOSQUIN, A., ZAGONEL, L. F., MYROSHNYCHENKO, V., RODRÍGUEZ-GONZÁLEZ, B., TENCÉ, M., SCARABELLI, L., FÖRSTNER, J., LIZ-MARZÁN, L. M., GARCÍA DE ABAJO, F. J., STÉPHAN, O., KOCIACK, M. Nano Letters, 2015, 15, 1229–1237 2015

Ready to revolutionize your materials characterization approach?

Get in touch with us today to discover how our state-of-the-art cathodoluminescence tools can elevate your research and industry applications.
Already more than 30 systems installed globally!